IJS Oprema

ID: 9718

Name: Time of flight secondary ion mass spectrometer TOF SIMS

Type: spectrometry

Owner: Institut "Jožef Stefan"

Dept.: F4

Year of acq.: 2011

KET field: Nanotechnology
Advanced materials

Price for usage (EUR/h): 100.60647058824

Responsible person: Janez Kovač

Responsible person email: Janez.Kovac@ijs.si

Possibilities to rent: Research is performed by researcher of JSI.

Purchase value (EUR): 690000

Description/Usage: TOF-SIMS spectrometer provides detailed elemental and molecular information about surfaces, thin layers and interfaces of organic and inorganic materials like polymers, biomaterials, semiconductors, coatings, paint, metals, ceramics, glass, pharmaceuticals...Mass resolution is about 10.000, lateral resolution is 100 nm and analysed depth is 2-3 monolayers.

JSI Inventory number: