Name: Time of flight secondary ion mass spectrometer TOF SIMS
Owner: Institut "Jožef Stefan"
Year of acq.: 2011
KET field: Nanotechnology
Price for usage (EUR/h): 100.60647058824
Responsible person: Janez Kovač
Responsible person email: Janez.Kovac@ijs.si
Possibilities to rent: Research is performed by researcher of JSI.
Purchase value (EUR): 690000
Description/Usage: TOF-SIMS spectrometer provides detailed elemental and molecular information about surfaces, thin layers and interfaces of organic and inorganic materials like polymers, biomaterials, semiconductors, coatings, paint, metals, ceramics, glass, pharmaceuticals...Mass resolution is about 10.000, lateral resolution is 100 nm and analysed depth is 2-3 monolayers.
JSI Inventory number: