IJS Oprema

ID: 9717

Name: Atomic force microscope AFM

Type: microscopy

Owner: Institut "Jožef Stefan"

Dept.: F4

Year of acq.: 2006

KET field: Nanotechnology
Advanced materials

Price for usage (EUR/h): 35.61

Responsible person: Janez Kovač

Responsible person email: Janez.Kovac@ijs.si

Possibilities to rent: Research is performed by researcher of JSI.

Purchase value (EUR): 45450

Description/Usage: AFM microscope provides information on topography on solid surfaces with very high spatial resolution. Analyses can be done over a region of 50 microns with accuracy of 0.1 nm. It is possible to measure the surface roughness, distribution of magnetic and electric fields and interaction forces between tip and substrate.

JSI Inventory number: