Name: Atomic force microscope AFM
Owner: Institut "Jožef Stefan"
Year of acq.: 2006
KET field: Nanotechnology
Price for usage (EUR/h): 35.61
Responsible person: Janez Kovač
Responsible person email: Janez.Kovac@ijs.si
Possibilities to rent: Research is performed by researcher of JSI.
Purchase value (EUR): 45450
Description/Usage: AFM microscope provides information on topography on solid surfaces with very high spatial resolution. Analyses can be done over a region of 50 microns with accuracy of 0.1 nm. It is possible to measure the surface roughness, distribution of magnetic and electric fields and interaction forces between tip and substrate.
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