IJS Oprema
ID: 9827
Name: The system for in-situ characterization of the samples and TEM sample Holder
Type: physical and chemical analysis
Owner: Center odličnosti NAMASTE, zavod za raziskave in razvoj naprednih nekovinskih materialov s tehnologijami prihodnosti
Dept.: K5
Year of acq.: 2011
KET field: Advanced materials
Micro- and Nano-electronics
Price for usage (EUR/h): Cena za uporabo raziskovalne opreme je skladna s priporočilom o zaračunavanju opreme.
Responsible person: Barbara Malič
Responsible person email: Barbara.Malic@ijs.si
Possibilities to rent: Research is performed by researcher of JSI.
Purchase value (EUR): 197520
Description/Usage: Allows in situ atomic force microscopy (AFM) and electrical characterization of the samples in the transmission electron microscope (TEM).
JSI Inventory number: