IJS Oprema

ID: 9827

Name: The system for in-situ characterization of the samples and TEM sample Holder

Type: physical and chemical analysis

Owner: Center odličnosti NAMASTE, zavod za raziskave in razvoj naprednih nekovinskih materialov s tehnologijami prihodnosti

Dept.: K5

Year of acq.: 2011

KET field: Advanced materials
Micro- and Nano-electronics

Price for usage (EUR/h): Cena za uporabo raziskovalne opreme je skladna s priporočilom o zaračunavanju opreme.

Responsible person: Barbara Malič

Responsible person email: Barbara.Malic@ijs.si

Possibilities to rent: Research is performed by researcher of JSI.

Purchase value (EUR): 197520

Description/Usage: Allows in situ atomic force microscopy (AFM) and electrical characterization of the samples in the transmission electron microscope (TEM).

JSI Inventory number:

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