Name: Scanning electron microscope with field emission gun (FEG) electron source (Jeol JEM-7600F)
Owner: Institut "Jožef Stefan"
Year of acq.: 2008
KET field: Nanotechnology
Micro- and Nano-electronics
Price for usage (EUR/h): 109.79
Responsible person: Miran Čeh
Responsible person email: Miran.Ceh@ijs.si
Possibilities to rent: Research is performed by researcher of JSI.
Purchase value (EUR): 676014
Description/Usage: The FEG-SEM is state-of-art scanning electron microscope that enables complete microstructural characterization of materials: image resolution of few nm, qualitative and quantitative chemical analysis on micron scale and electron litography.
JSI Inventory number: