IJS Oprema

ID: 9647

Name: Scanning electron microscope with field emission gun (FEG) electron source (Jeol JEM-7600F)

Type: microscopy

Owner: Institut "Jožef Stefan"

Dept.: CEMM

Year of acq.: 2008

KET field: Nanotechnology
Advanced materials
Micro- and Nano-electronics

Price for usage (EUR/h): 109.79

Responsible person: Miran Čeh

Responsible person email: Miran.Ceh@ijs.si

Possibilities to rent: Research is performed by researcher of JSI.

Purchase value (EUR): 676014

Description/Usage: The FEG-SEM is state-of-art scanning electron microscope that enables complete microstructural characterization of materials: image resolution of few nm, qualitative and quantitative chemical analysis on micron scale and electron litography.

JSI Inventory number: